Unmatched Accuracy in Predicting Radiation Effects for Mission-Critical Systems

Introduction
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JRC’s Accuro simulation suite transforms how engineers evaluate and optimize radiation hardened integrated circuits. The suite delivers device and circuit level physics-based simulations with high fidelity in radiation-stressed environments. Accuro delivers real-time insights across 2D and 3D device behavior, empowering engineers to design confidently under radiation-intense conditions.

In aerospace, defense, and nuclear environments, radiation-induced failures in microelectronics can jeopardize mission success and national security. From satellite avionics to strategic deterrence systems, resilience begins at the design stage. JRC’s Accuro Tool Suite empowers semiconductor engineers to predict, mitigate, and optimize against radiation effects before tape-out, and improves first-silicon success. Our cutting-edge simulation platform offers quick predictive insights, enabling the design of radiation-hardened microelectronics that perform with precision and reliability in the radiation environments.

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Included specialize in
JRC
What We Provide

Our proprietary suite of analysis tools equips integrated circuit engineers with deep simulation capabilities for predicting and mitigating radiation vulnerabilities in microelectronics.

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Layout level radiation vulnerability analysis with targeted optimization guidance
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Single-Event Upset (SEU) and Soft Error Rate (SER) modeling
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2D/3D radiation effect simulations for advanced circuit insight
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Seamless integration into semiconductor design workflows

Our Key toolkits include

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Accuro

Real-time predictive modeling of transient and permanent faults

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Review

Visualize and analyze radiation effects at multiple scales for 2D/3D model

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Explore

management of simulation experiments and results evaluation

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Defense-Cleared Engineering Teams

Integrated support for defense and aerospace system requirements

What Sets Us Apart
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    Layout-aware Single Event Upset & transient modeling for pinpoint soft error mapping
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    Realistic condition modeling for dependable performance estimates
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    Empowers layout decisions for lower SER risk and enhanced energy efficiency
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    Unrivaled Predictive Accuracy – Trusted by top defense integrators for pinpoint SER and SEU modeling
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    Proprietary Simulation Stack – Built in-house, optimized specifically for defense microelectronics
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    Designed for Deployment – Tools aligned with real-world mission constraints, not lab-only conditions
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    Aerospace & Nuclear Certified – Meets stringent standards across multiple federal domains
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Why JRC